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1 article(s) from Harrison, Richard J

Helium ion microscope – secondary ion mass spectrometry for geological materials

Matthew R. Ball,
Richard J. M. Taylor,
Joshua F. Einsle,
Fouzia Khanom,
Christelle Guillermier and
Richard J. Harrison

Beilstein J. Nanotechnol. 2020, 11, 1504–1515, doi:10.3762/bjnano.11.133

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Figure 1: Mass spectra of a natural zircon sample before rastering with the primary beam (red) and after rast...

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Figure 2: a) Backscattered electron (BSE) map of the sample, SIMS location outlined in red; b) raw and proces...

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Figure 3: The calculated sputtering yield as a function of the atomic number for a 10 kV primary Ne beam impa...

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Figure 4: Reflected-light micrograph of the analysed Spodumene grain. The grain has relatively unaltered regi...

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Figure 5: a) Raw (solid line), b) 32 × 32 regridded (dotted line) and c) 64 × 64 regridded (dashed line) maps...

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Figure 6: The relative δ⁷Li ratios for regions within the same grain of Spodumene as in Figure 4 and Figure 5. Four connected...

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Figure 7: a) Backscatter electron image of the region of interest. The red square shows the region mapped usi...

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Figure 8: Count rates relative to background count rates for ⁶Li (red, 3 μg/g) and ⁷Li (green, 37 μg/g) for t...

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Figure 9: The relative δ⁷Li ratios for regions within the same grain of Spodumene. Values are not calibrated ...

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Figure 10: a) Examples of deformed cleavage planes in a Li-rich biotite mica shown parallel to the c-axis and ...

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Published 02 Oct 2020

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